%0 Journal Article %1 journals/tc/BlantonH96 %A Blanton, Ronald D. %A Hayes, John P. %D 1996 %J IEEE Trans. Computers %K dblp %N 8 %P 950-963 %T Testability of Convergent Tree Circuits. %U http://dblp.uni-trier.de/db/journals/tc/tc45.html#BlantonH96 %V 45

@article{journals/tc/BlantonH96, added-at = {2015-12-22T00:00:00.000+0100}, author = {Blanton, Ronald D. and Hayes, John P.}, biburl = {https://www.bibsonomy.org/bibtex/2093fc716c05a8a5c84220efddc44a60e/dblp}, ee = {http://doi.ieeecomputersociety.org/10.1109/12.536237}, interhash = {cfb6587d7538df7ef5f782d267d6bf84}, intrahash = {093fc716c05a8a5c84220efddc44a60e}, journal = {IEEE Trans. Computers}, keywords = {dblp}, number = 8, pages = {950-963}, timestamp = {2015-12-24T11:37:24.000+0100}, title = {Testability of Convergent Tree Circuits.}, url = {http://dblp.uni-trier.de/db/journals/tc/tc45.html#BlantonH96}, volume = 45, year = 1996 }