%0 Conference Paper %1 conf/ddecs/KerkhoffE15 %A Kerkhoff, Hans G. %A Ebrahimi, Hassan %B DDECS %D 2015 %E Stamenkovic, Zoran %E Pleskacz, Witold A. %E Raik, Jaan %E Vierhaus, Heinrich Theodor %I IEEE Computer Society %K dblp %P 211-216 %T Intermittent Resistive Faults in Digital CMOS Circuits. %U http://dblp.uni-trier.de/db/conf/ddecs/ddecs2015.html#KerkhoffE15 %@ 978-1-4799-6780-3

@inproceedings{conf/ddecs/KerkhoffE15, added-at = {2023-03-24T00:00:00.000+0100}, author = {Kerkhoff, Hans G. and Ebrahimi, Hassan}, biburl = {https://www.bibsonomy.org/bibtex/22d2f9ad61ff7e997a9f451f6a8c1e86e/dblp}, booktitle = {DDECS}, crossref = {conf/ddecs/2015}, editor = {Stamenkovic, Zoran and Pleskacz, Witold A. and Raik, Jaan and Vierhaus, Heinrich Theodor}, ee = {https://doi.ieeecomputersociety.org/10.1109/DDECS.2015.12}, interhash = {1d551bfc9a7e0a677c80555262c9a873}, intrahash = {2d2f9ad61ff7e997a9f451f6a8c1e86e}, isbn = {978-1-4799-6780-3}, keywords = {dblp}, pages = {211-216}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:41:24.000+0200}, title = {Intermittent Resistive Faults in Digital CMOS Circuits.}, url = {http://dblp.uni-trier.de/db/conf/ddecs/ddecs2015.html#KerkhoffE15}, year = 2015 }