%0 Conference Paper %1 conf/ets/GinezPM09 %A Ginez, Olivier %A Portal, Jean-Michel %A Muller, Christophe %B ETS %D 2009 %I IEEE Computer Society %K dblp %P 61-66 %T Design and Test Challenges in Resistive Switching RAM (ReRAM): An Electrical Model for Defect Injections. %U http://dblp.uni-trier.de/db/conf/ets/ets2009.html#GinezPM09 %@ 978-0-7695-3703-0

@inproceedings{conf/ets/GinezPM09, added-at = {2023-03-23T00:00:00.000+0100}, author = {Ginez, Olivier and Portal, Jean-Michel and Muller, Christophe}, biburl = {https://www.bibsonomy.org/bibtex/2a3db3e9e738df818ddf4db872fc9d2ca/dblp}, booktitle = {ETS}, crossref = {conf/ets/2009}, ee = {https://doi.ieeecomputersociety.org/10.1109/ETS.2009.23}, interhash = {d5e423a4a354168993f6a45160904a69}, intrahash = {a3db3e9e738df818ddf4db872fc9d2ca}, isbn = {978-0-7695-3703-0}, keywords = {dblp}, pages = {61-66}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T20:47:13.000+0200}, title = {Design and Test Challenges in Resistive Switching RAM (ReRAM): An Electrical Model for Defect Injections.}, url = {http://dblp.uni-trier.de/db/conf/ets/ets2009.html#GinezPM09}, year = 2009 }