%0 Journal Article %1 journals/tcad/Brand93 %A Brand, Daniel %D 1993 %J IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. %K dblp %N 11 %P 1635-1641 %T Exhaustive simulation need not require an exponential number of tests. %U http://dblp.uni-trier.de/db/journals/tcad/tcad12.html#Brand93 %V 12

@article{journals/tcad/Brand93, added-at = {2020-09-24T00:00:00.000+0200}, author = {Brand, Daniel}, biburl = {https://www.bibsonomy.org/bibtex/270e55d06c174b4af76bdf7582347e476/dblp}, ee = {https://doi.org/10.1109/43.248074}, interhash = {d7f368d955116eba94ae47eaec988367}, intrahash = {70e55d06c174b4af76bdf7582347e476}, journal = {IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.}, keywords = {dblp}, number = 11, pages = {1635-1641}, timestamp = {2020-09-25T11:49:54.000+0200}, title = {Exhaustive simulation need not require an exponential number of tests.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad12.html#Brand93}, volume = 12, year = 1993 }