%0 Journal Article %1 journals/dt/KrishnanK13 %A Krishnan, Shaji %A Kerkhoff, Hans G. %D 2013 %J IEEE Des. Test %K dblp %N 3 %P 18-24 %T Exploiting Multiple Mahalanobis Distance Metrics to Screen Outliers From Analog Product Manufacturing Test Responses. %U http://dblp.uni-trier.de/db/journals/dt/dt30.html#KrishnanK13 %V 30

@article{journals/dt/KrishnanK13, added-at = {2020-03-13T00:00:00.000+0100}, author = {Krishnan, Shaji and Kerkhoff, Hans G.}, biburl = {https://www.bibsonomy.org/bibtex/2643d74a9bdfb6afeeaf6c1be32a89bcb/dblp}, ee = {https://doi.org/10.1109/MDT.2012.2206552}, interhash = {d89c00a45a918885c7b03f2eab24acf5}, intrahash = {643d74a9bdfb6afeeaf6c1be32a89bcb}, journal = {IEEE Des. Test}, keywords = {dblp}, number = 3, pages = {18-24}, timestamp = {2020-03-14T12:05:59.000+0100}, title = {Exploiting Multiple Mahalanobis Distance Metrics to Screen Outliers From Analog Product Manufacturing Test Responses.}, url = {http://dblp.uni-trier.de/db/journals/dt/dt30.html#KrishnanK13}, volume = 30, year = 2013 }