%0 Conference Paper %1 conf/vlsid/BaikSK04 %A Baik, Dong Hyun %A Saluja, Kewal K. %A Kajihara, Seiji %B VLSI Design %D 2004 %I IEEE Computer Society %K dblp %P 883-888 %T Random Access Scan: A solution to test power, test data volume and test time. %U http://dblp.uni-trier.de/db/conf/vlsid/vlsid2004.html#BaikSK04 %@ 0-7695-2072-3

@inproceedings{conf/vlsid/BaikSK04, added-at = {2023-03-24T00:00:00.000+0100}, author = {Baik, Dong Hyun and Saluja, Kewal K. and Kajihara, Seiji}, biburl = {https://www.bibsonomy.org/bibtex/25826e812765cf972b7c314591f9c80ba/dblp}, booktitle = {VLSI Design}, crossref = {conf/vlsid/2004}, ee = {https://doi.ieeecomputersociety.org/10.1109/ICVD.2004.1261042}, interhash = {dd5e86b147481b95313aafef3d288d6b}, intrahash = {5826e812765cf972b7c314591f9c80ba}, isbn = {0-7695-2072-3}, keywords = {dblp}, pages = {883-888}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:18:22.000+0200}, title = {Random Access Scan: A solution to test power, test data volume and test time.}, url = {http://dblp.uni-trier.de/db/conf/vlsid/vlsid2004.html#BaikSK04}, year = 2004 }