Inproceedings,
Physics Based Fault Models for Testing High-Voltage LDMOS.
S. Kannan, B. Kim, A. Gupta, F. Taenzler, R. Antley, and K. Moushegian.VLSI Design, page 285-290. IEEE Computer Society, (2013)
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- inproceedings
- booktitle
- VLSI Design
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- 2013
- pages
- 285-290
- publisher
- IEEE Computer Society
- crossref
- conf/vlsid/2013
- ee
- https://doi.ieeecomputersociety.org/10.1109/VLSID.2013.202
- isbn
- 978-1-4673-4639-9
- url
- http://dblp.uni-trier.de/db/conf/vlsid/vlsid2013.html#KannanKGTAM13
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- please select -%0 Conference Paper
%1 conf/vlsid/KannanKGTAM13
%A Kannan, Sukeshwar
%A Kim, Bruce C.
%A Gupta, Anurag
%A Taenzler, Friedrich
%A Antley, Richard
%A Moushegian, Ken
%B VLSI Design
%D 2013
%I IEEE Computer Society
%K dblp
%P 285-290
%T Physics Based Fault Models for Testing High-Voltage LDMOS.
%U http://dblp.uni-trier.de/db/conf/vlsid/vlsid2013.html#KannanKGTAM13
%@ 978-1-4673-4639-9
@inproceedings{conf/vlsid/KannanKGTAM13,
added-at = {2023-03-24T00:00:00.000+0100},
author = {Kannan, Sukeshwar and Kim, Bruce C. and Gupta, Anurag and Taenzler, Friedrich and Antley, Richard and Moushegian, Ken},
biburl = {https://www.bibsonomy.org/bibtex/200fbb7efba43d40be53c029d60d0484c/dblp},
booktitle = {VLSI Design},
crossref = {conf/vlsid/2013},
ee = {https://doi.ieeecomputersociety.org/10.1109/VLSID.2013.202},
interhash = {ea9de50fd425ebdb4b9d112e5ebd1d34},
intrahash = {00fbb7efba43d40be53c029d60d0484c},
isbn = {978-1-4673-4639-9},
keywords = {dblp},
pages = {285-290},
publisher = {IEEE Computer Society},
timestamp = {2024-04-10T04:08:28.000+0200},
title = {Physics Based Fault Models for Testing High-Voltage LDMOS.},
url = {http://dblp.uni-trier.de/db/conf/vlsid/vlsid2013.html#KannanKGTAM13},
year = 2013
}