%0 Conference Paper %1 conf/cicc/ChanRIYMTYO05 %A Chan, Victor %A Rim, Ken %A Ieong, Meikei %A Yang, Sam %A Malik, Rajeev %A Teh, Young Way %A Yang, Min %A Ouyang, Qiqing %B CICC %D 2005 %I IEEE %K dblp %P 667-674 %T Strain for CMOS performance improvement. %U http://dblp.uni-trier.de/db/conf/cicc/cicc2005.html#ChanRIYMTYO05 %@ 0-7803-9023-7

@inproceedings{conf/cicc/ChanRIYMTYO05, added-at = {2021-11-15T00:00:00.000+0100}, author = {Chan, Victor and Rim, Ken and Ieong, Meikei and Yang, Sam and Malik, Rajeev and Teh, Young Way and Yang, Min and Ouyang, Qiqing}, biburl = {https://www.bibsonomy.org/bibtex/2c150780336cbfbc63fbb098919e290c6/dblp}, booktitle = {CICC}, crossref = {conf/cicc/2005}, ee = {https://doi.org/10.1109/CICC.2005.1568758}, interhash = {ebfe79acc527b775e2ebd8d9dad09027}, intrahash = {c150780336cbfbc63fbb098919e290c6}, isbn = {0-7803-9023-7}, keywords = {dblp}, pages = {667-674}, publisher = {IEEE}, timestamp = {2024-04-10T22:11:20.000+0200}, title = {Strain for CMOS performance improvement.}, url = {http://dblp.uni-trier.de/db/conf/cicc/cicc2005.html#ChanRIYMTYO05}, year = 2005 }