Please log in to take part in the discussion (add own reviews or comments).
Cite this publication
More citation styles
- please select -
%0 Journal Article
%1 journals/mr/VargheseRKA14
%A Varghese, D.
%A Reddy, V.
%A Krishnan, S.
%A Alam, Muhammad Ashraful
%D 2014
%J Microelectron. Reliab.
%K dblp
%N 8
%P 1477-1488
%T OFF-state degradation and correlated gate dielectric breakdown in high voltage drain extended transistors: A review.
%U http://dblp.uni-trier.de/db/journals/mr/mr54.html#VargheseRKA14
%V 54
@article{journals/mr/VargheseRKA14,
added-at = {2020-02-22T00:00:00.000+0100},
author = {Varghese, D. and Reddy, V. and Krishnan, S. and Alam, Muhammad Ashraful},
biburl = {https://www.bibsonomy.org/bibtex/276e4a484159699bf43473eaf32dc4806/dblp},
ee = {https://doi.org/10.1016/j.microrel.2014.03.013},
interhash = {efd038061863863f05bff0321d94e17f},
intrahash = {76e4a484159699bf43473eaf32dc4806},
journal = {Microelectron. Reliab.},
keywords = {dblp},
number = 8,
pages = {1477-1488},
timestamp = {2020-02-25T13:28:53.000+0100},
title = {OFF-state degradation and correlated gate dielectric breakdown in high voltage drain extended transistors: A review.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr54.html#VargheseRKA14},
volume = 54,
year = 2014
}