:P\:\\KAI_AP2\\People\\Bluder\Łiteratur\\Semiconductor_lifetime_prediction\\CIAPPA_et_al_Lifetime_Extrapolation for IGBT Modules under realisitc operation conditions.pdf:PDF
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%0 Journal Article
%1 CIAP1999
%A Ciappa, M.
%A Malberti, P.
%A Fichtner, W.
%A Cova, P.
%A Cattani, L.
%A Fantini, F.
%D 1999
%J Microelectronics Reliability
%K imported
%N 6-7
%P 1131--1136
%T Lifetime Extrapolation for IGBT Modules under Realistic Operation
Conditions
%V 39
@article{CIAP1999,
added-at = {2013-01-07T16:10:56.000+0100},
author = {Ciappa, M. and Malberti, P. and Fichtner, W. and Cova, P. and Cattani, L. and Fantini, F.},
biburl = {https://www.bibsonomy.org/bibtex/264b8432e2c8875adc7387d8083fee3c3/olivia.bluder},
file = {:P\:\\KAI_AP2\\People\\Bluder\\Literatur\\Semiconductor_lifetime_prediction\\CIAPPA_et_al_Lifetime_Extrapolation for IGBT Modules under realisitc operation conditions.pdf:PDF},
interhash = {f1f823fdec74e60e8ab71d9bf0bf8fda},
intrahash = {64b8432e2c8875adc7387d8083fee3c3},
journal = {Microelectronics Reliability},
keywords = {imported},
number = {6-7},
owner = {bluder},
pages = {1131--1136},
timestamp = {2013-01-07T16:11:12.000+0100},
title = {Lifetime Extrapolation for {IGBT} Modules under Realistic Operation
Conditions},
volume = 39,
year = 1999
}
