%0 Journal Article %1 journals/candie/Tirkel16 %A Tirkel, Israel %D 2016 %J Comput. Ind. Eng. %K dblp %P 458-464 %T The efficiency of inspection based on out of control detection in wafer fabrication. %U http://dblp.uni-trier.de/db/journals/candie/candie99.html#Tirkel16 %V 99

@article{journals/candie/Tirkel16, added-at = {2020-02-20T00:00:00.000+0100}, author = {Tirkel, Israel}, biburl = {https://www.bibsonomy.org/bibtex/204ab6be80e0c2ed97af32078d86025e2/dblp}, ee = {https://doi.org/10.1016/j.cie.2016.05.022}, interhash = {f302273342390affa87fb0f3d69b1968}, intrahash = {04ab6be80e0c2ed97af32078d86025e2}, journal = {Comput. Ind. Eng.}, keywords = {dblp}, pages = {458-464}, timestamp = {2020-02-21T12:55:49.000+0100}, title = {The efficiency of inspection based on out of control detection in wafer fabrication.}, url = {http://dblp.uni-trier.de/db/journals/candie/candie99.html#Tirkel16}, volume = 99, year = 2016 }