%0 Journal Article %1 journals/tvlsi/ZhangIFTS12 %A Zhang, Xin %A Ishida, Koichi %A Fuketa, Hiroshi %A Takamiya, Makoto %A Sakurai, Takayasu %D 2012 %J IEEE Trans. Very Large Scale Integr. Syst. %K dblp %N 10 %P 1876-1880 %T On-Chip Measurement System for Within-Die Delay Variation of Individual Standard Cells in 65-nm CMOS. %U http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi20.html#ZhangIFTS12 %V 20

@article{journals/tvlsi/ZhangIFTS12, added-at = {2020-03-11T00:00:00.000+0100}, author = {Zhang, Xin and Ishida, Koichi and Fuketa, Hiroshi and Takamiya, Makoto and Sakurai, Takayasu}, biburl = {https://www.bibsonomy.org/bibtex/202f21576680aaa1606b0c4d18ae9b45a/dblp}, ee = {https://doi.org/10.1109/TVLSI.2011.2162257}, interhash = {f6b23491eb7d13d8b09bf6efcb6b1ee9}, intrahash = {02f21576680aaa1606b0c4d18ae9b45a}, journal = {IEEE Trans. Very Large Scale Integr. Syst.}, keywords = {dblp}, number = 10, pages = {1876-1880}, timestamp = {2020-03-12T11:41:10.000+0100}, title = {On-Chip Measurement System for Within-Die Delay Variation of Individual Standard Cells in 65-nm CMOS.}, url = {http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi20.html#ZhangIFTS12}, volume = 20, year = 2012 }