%0 Conference Paper %1 conf/mtdt/WangMCD06 %A Wang, Hua %A Miranda, Miguel %A Catthoor, Francky %A Dehaene, Wim %B MTDT %D 2006 %I IEEE Computer Society %K dblp %P 71-76 %T On the Combined Impact of Soft and Medium Gate Oxide Breakdown and Process Variability on the Parametric Figures of SRAM components. %U http://dblp.uni-trier.de/db/conf/mtdt/mtdt2006.html#WangMCD06 %@ 0-7695-2572-5

@inproceedings{conf/mtdt/WangMCD06, added-at = {2023-03-24T00:00:00.000+0100}, author = {Wang, Hua and Miranda, Miguel and Catthoor, Francky and Dehaene, Wim}, biburl = {https://www.bibsonomy.org/bibtex/2d51a56b1b85edc6b5ca8226b72d6fbca/dblp}, booktitle = {MTDT}, crossref = {conf/mtdt/2006}, ee = {https://doi.ieeecomputersociety.org/10.1109/MTDT.2006.23}, interhash = {f8d7a3b1d5937c06b68a101a8e4b74d5}, intrahash = {d51a56b1b85edc6b5ca8226b72d6fbca}, isbn = {0-7695-2572-5}, keywords = {dblp}, pages = {71-76}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T16:53:54.000+0200}, title = {On the Combined Impact of Soft and Medium Gate Oxide Breakdown and Process Variability on the Parametric Figures of SRAM components.}, url = {http://dblp.uni-trier.de/db/conf/mtdt/mtdt2006.html#WangMCD06}, year = 2006 }