%0 Conference Paper %1 conf/ats/Parekhji05 %A Parekhji, Rubin A. %B Asian Test Symposium %D 2005 %I IEEE Computer Society %K dblp %P 451 %T DFT for Low Cost SOC Test. %U http://dblp.uni-trier.de/db/conf/ats/ats2005.html#Parekhji05 %@ 0-7695-2481-8

@inproceedings{conf/ats/Parekhji05, added-at = {2023-03-24T00:00:00.000+0100}, author = {Parekhji, Rubin A.}, biburl = {https://www.bibsonomy.org/bibtex/252b1776ec1f554dd57af9b2cf7d92fcf/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2005}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2005.51}, interhash = {fbacc6587ce3a2ada745a518126c19b9}, intrahash = {52b1776ec1f554dd57af9b2cf7d92fcf}, isbn = {0-7695-2481-8}, keywords = {dblp}, pages = 451, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:36:05.000+0200}, title = {DFT for Low Cost SOC Test.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2005.html#Parekhji05}, year = 2005 }