Efficient Test Suite Reduction by Merging Pairs of Suitable Test Cases
H. Cichos, and T. Heinze. Proceedings of the 7th International Workshop on Model-Driven Engineering, Verification and Validation (MoDeVVa 2010), volume 6627 of IEEE Computer Society Press, page 244–258. IEEE Computer Society Press, (2011)
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%0 Conference Paper
%1 Cichos.2011
%A Cichos, Harald
%A Heinze, Thomas S.
%B Proceedings of the 7th International Workshop on Model-Driven Engineering, Verification and Validation (MoDeVVa 2010)
%D 2011
%I IEEE Computer Society Press
%K Informatik
%P 244–258
%T Efficient Test Suite Reduction by Merging Pairs of Suitable Test Cases
%V 6627
@inproceedings{Cichos.2011,
added-at = {2013-10-18T15:39:56.000+0200},
author = {Cichos, Harald and Heinze, Thomas S.},
biburl = {https://www.bibsonomy.org/bibtex/23dcfe8038eb4133746abaac3bf5893c1/hlackner},
booktitle = {Proceedings of the 7th International Workshop on Model-Driven Engineering, Verification and Validation (MoDeVVa 2010)},
interhash = {fc12d4f162286c4034b93db0ba1b4cdf},
intrahash = {3dcfe8038eb4133746abaac3bf5893c1},
keywords = {Informatik},
pages = {244–258},
publisher = {IEEE Computer Society Press},
series = {IEEE Computer Society Press},
timestamp = {2013-10-18T15:39:56.000+0200},
title = {Efficient Test Suite Reduction by Merging Pairs of Suitable Test Cases},
volume = 6627,
year = 2011
}