%0 Journal Article %1 journals/dt/ChatterjeeKN96 %A Chatterjee, Abhijit %A Kim, Bruce C. %A Nagi, Naveena %D 1996 %J IEEE Des. Test Comput. %K dblp %N 2 %P 26-33 %T DC Built-In Self-Test for Linear Analog Circuits. %U http://dblp.uni-trier.de/db/journals/dt/dt13.html#ChatterjeeKN96 %V 13

@article{journals/dt/ChatterjeeKN96, added-at = {2020-05-17T00:00:00.000+0200}, author = {Chatterjee, Abhijit and Kim, Bruce C. and Nagi, Naveena}, biburl = {https://www.bibsonomy.org/bibtex/2dbb8a3c72e55ba030ab154965cd775cc/dblp}, ee = {http://doi.ieeecomputersociety.org/10.1109/54.500198}, interhash = {fe7074f3c058e57f512821592112af52}, intrahash = {dbb8a3c72e55ba030ab154965cd775cc}, journal = {IEEE Des. Test Comput.}, keywords = {dblp}, number = 2, pages = {26-33}, timestamp = {2020-05-19T12:21:31.000+0200}, title = {DC Built-In Self-Test for Linear Analog Circuits.}, url = {http://dblp.uni-trier.de/db/journals/dt/dt13.html#ChatterjeeKN96}, volume = 13, year = 1996 }