%0 Conference Paper %1 conf/ats/RavikumarSA95 %A Ravikumar, C. P. %A Saund, Gurjeet S. %A Agrawal, Nidhi %B Asian Test Symposium %D 1995 %I IEEE Computer Society %K dblp %P 192-198 %T A STAFAN-like functional testability measure for register-level circuits. %U http://dblp.uni-trier.de/db/conf/ats/ats1995.html#RavikumarSA95 %@ 0-8186-7129-7

@inproceedings{conf/ats/RavikumarSA95, added-at = {2023-03-24T00:00:00.000+0100}, author = {Ravikumar, C. P. and Saund, Gurjeet S. and Agrawal, Nidhi}, biburl = {https://www.bibsonomy.org/bibtex/207778bc49c62c429eff6f017e3f47176/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/1995}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.1995.485336}, interhash = {23088d811adec12dd1a44582a97bfa21}, intrahash = {07778bc49c62c429eff6f017e3f47176}, isbn = {0-8186-7129-7}, keywords = {dblp}, pages = {192-198}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:35:47.000+0200}, title = {A STAFAN-like functional testability measure for register-level circuits.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats1995.html#RavikumarSA95}, year = 1995 }