%0 Conference Paper %1 conf/cicc/YangHL06 %A Yang, Fu-Liang %A Hwang, Jiunn-Ren %A Li, Yiming %B CICC %D 2006 %I IEEE %K dblp %P 691-694 %T Electrical Characteristic Fluctuations in Sub-45nm CMOS Devices. %U http://dblp.uni-trier.de/db/conf/cicc/cicc2006.html#YangHL06 %@ 1-4244-0075-9

@inproceedings{conf/cicc/YangHL06, added-at = {2023-02-24T00:00:00.000+0100}, author = {Yang, Fu-Liang and Hwang, Jiunn-Ren and Li, Yiming}, biburl = {https://www.bibsonomy.org/bibtex/20832488416e1d807e54cd00c4af88f36/dblp}, booktitle = {CICC}, crossref = {conf/cicc/2006}, ee = {https://doi.org/10.1109/CICC.2006.320881}, interhash = {707ace216eaa2b5e4730549b72fce126}, intrahash = {0832488416e1d807e54cd00c4af88f36}, isbn = {1-4244-0075-9}, keywords = {dblp}, pages = {691-694}, publisher = {IEEE}, timestamp = {2024-04-10T22:11:27.000+0200}, title = {Electrical Characteristic Fluctuations in Sub-45nm CMOS Devices.}, url = {http://dblp.uni-trier.de/db/conf/cicc/cicc2006.html#YangHL06}, year = 2006 }