%0 Conference Paper %1 conf/ats/KimYLK05 %A Kim, Youbean %A Yang, Myung-Hoon %A Lee, Yong %A Kang, Sungho %B Asian Test Symposium %D 2005 %I IEEE Computer Society %K dblp %P 230-235 %T A New Low Power Test Pattern Generator using a Transition Monitoring Window based on BIST Architecture. %U http://dblp.uni-trier.de/db/conf/ats/ats2005.html#KimYLK05 %@ 0-7695-2481-8

@inproceedings{conf/ats/KimYLK05, added-at = {2024-02-28T00:00:00.000+0100}, author = {Kim, Youbean and Yang, Myung-Hoon and Lee, Yong and Kang, Sungho}, biburl = {https://www.bibsonomy.org/bibtex/2a95dbf58f43dc37bc514769678b18680/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2005}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2005.12}, interhash = {20c78608aeec97719c284db1c147d118}, intrahash = {a95dbf58f43dc37bc514769678b18680}, isbn = {0-7695-2481-8}, keywords = {dblp}, pages = {230-235}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:36:05.000+0200}, title = {A New Low Power Test Pattern Generator using a Transition Monitoring Window based on BIST Architecture.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2005.html#KimYLK05}, year = 2005 }