%0 Conference Paper %1 conf/dsn/RohaniK11 %A Rohani, Alireza %A Kerkhoff, Hans G. %B DSN Workshops %D 2011 %I IEEE Computer Society %K dblp %P 41-46 %T Study of the effects of SET induced faults on submicron technologies. %U http://dblp.uni-trier.de/db/conf/dsn/dsnw2011.html#RohaniK11 %@ 978-1-4577-0374-4

@inproceedings{conf/dsn/RohaniK11, added-at = {2023-03-24T00:00:00.000+0100}, author = {Rohani, Alireza and Kerkhoff, Hans G.}, biburl = {https://www.bibsonomy.org/bibtex/20d795d434d60a5bde9be8d1dcabf92a5/dblp}, booktitle = {DSN Workshops}, crossref = {conf/dsn/2011w}, ee = {https://doi.ieeecomputersociety.org/10.1109/DSNW.2011.5958833}, interhash = {335e416e2b88a00e03a4fd844d96a14f}, intrahash = {0d795d434d60a5bde9be8d1dcabf92a5}, isbn = {978-1-4577-0374-4}, keywords = {dblp}, pages = {41-46}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T16:39:29.000+0200}, title = {Study of the effects of SET induced faults on submicron technologies.}, url = {http://dblp.uni-trier.de/db/conf/dsn/dsnw2011.html#RohaniK11}, year = 2011 }