%0 Conference Paper %1 conf/iscsct/JinLWS08 %A hua Jin, Shao %A guo Lu, Jian %A ping Wan, Yan %A guang Sun, Shu %B ISCSCT (1) %D 2008 %I IEEE Computer Society %K dblp %P 430-433 %T The Bayesian Analysis of Reliability of Electrical Products. %U http://dblp.uni-trier.de/db/conf/iscsct/iscsct2008-1.html#JinLWS08 %@ 978-0-7695-3498-5

@inproceedings{conf/iscsct/JinLWS08, added-at = {2023-03-23T00:00:00.000+0100}, author = {hua Jin, Shao and guo Lu, Jian and ping Wan, Yan and guang Sun, Shu}, biburl = {https://www.bibsonomy.org/bibtex/2118d842d023f71849ed340e55e9e8661/dblp}, booktitle = {ISCSCT (1)}, crossref = {conf/iscsct/2008}, ee = {https://doi.ieeecomputersociety.org/10.1109/ISCSCT.2008.32}, interhash = {fd75caca7f87d46bab81419c4deed445}, intrahash = {118d842d023f71849ed340e55e9e8661}, isbn = {978-0-7695-3498-5}, keywords = {dblp}, pages = {430-433}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T05:25:53.000+0200}, title = {The Bayesian Analysis of Reliability of Electrical Products.}, url = {http://dblp.uni-trier.de/db/conf/iscsct/iscsct2008-1.html#JinLWS08}, year = 2008 }