%0 Conference Paper %1 conf/itc/HouCLLKC16 %A Hou, Chih-Sheng %A Chen, Yong-Xiao %A Li, Jin-Fu %A Lo, Chih-Yen %A Kwai, Ding-Ming %A Chou, Yung-Fa %B ITC %D 2016 %I IEEE %K dblp %P 1-7 %T A built-in self-repair scheme for DRAMs with spare rows, columns, and bits. %U http://dblp.uni-trier.de/db/conf/itc/itc2016.html#HouCLLKC16 %@ 978-1-4673-8773-6

@inproceedings{conf/itc/HouCLLKC16, added-at = {2023-10-17T00:00:00.000+0200}, author = {Hou, Chih-Sheng and Chen, Yong-Xiao and Li, Jin-Fu and Lo, Chih-Yen and Kwai, Ding-Ming and Chou, Yung-Fa}, biburl = {https://www.bibsonomy.org/bibtex/21cbfebc1f0129bf4a5255ddb2e7ee92e/dblp}, booktitle = {ITC}, crossref = {conf/itc/2016}, ee = {https://doi.org/10.1109/TEST.2016.7805832}, interhash = {e87583c8d09588f883ebef24dd075547}, intrahash = {1cbfebc1f0129bf4a5255ddb2e7ee92e}, isbn = {978-1-4673-8773-6}, keywords = {dblp}, pages = {1-7}, publisher = {IEEE}, timestamp = {2024-04-10T04:29:36.000+0200}, title = {A built-in self-repair scheme for DRAMs with spare rows, columns, and bits.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2016.html#HouCLLKC16}, year = 2016 }