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Mechanical and electrical reliability of copper interconnections for 3DIC.

Naoki Saito, Naokazu Murata, Kinji Tamakawa, Ken Suzuki, and Hideo Miura. 3DIC, page 1-6. IEEE, (2011)

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http://dblp.uni-trier.de/db/conf/3dic/3dic2011.html#SaitoMTSM11
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conf/3dic/SaitoMTSM11
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