%0 Journal Article %1 journals/technometrics/ChenWW17 %A Chen, Ray-Bing %A Wang, Weichung %A Wu, C. F. Jeff %D 2017 %J Technometrics %K dblp %N 2 %P 139-152 %T Sequential Designs Based on Bayesian Uncertainty Quantification in Sparse Representation Surrogate Modeling. %U http://dblp.uni-trier.de/db/journals/technometrics/technometrics59.html#ChenWW17 %V 59

@article{journals/technometrics/ChenWW17, added-at = {2022-10-02T00:00:00.000+0200}, author = {Chen, Ray-Bing and Wang, Weichung and Wu, C. F. Jeff}, biburl = {https://www.bibsonomy.org/bibtex/21e1eeeac23ba2a3561d61e56566b61ef/dblp}, ee = {https://doi.org/10.1080/00401706.2016.1172027}, interhash = {f9756e1d045c961f118e0b5d8771457c}, intrahash = {1e1eeeac23ba2a3561d61e56566b61ef}, journal = {Technometrics}, keywords = {dblp}, number = 2, pages = {139-152}, timestamp = {2024-04-08T09:56:20.000+0200}, title = {Sequential Designs Based on Bayesian Uncertainty Quantification in Sparse Representation Surrogate Modeling.}, url = {http://dblp.uni-trier.de/db/journals/technometrics/technometrics59.html#ChenWW17}, volume = 59, year = 2017 }