@article{journals/mr/AresuCKMMSDKDD03,
title = {A new method for the analysis of high-resolution SILC data.},
author = {S. Aresu and W. De Ceuninck and G. Knuyt and J. Mertens and J. Manca and L. De Schepper and Robin Degraeve and Ben Kaczer and M. D'Olieslaeger and J. D'Haen},
journal = {Microelectronics Reliability},
number = {9-11},
pages = {1483-1488},
url = {http://dblp.uni-trier.de/db/journals/mr/mr43.html#AresuCKMMSDKDD03},
volume = {43},
year = {2003},
description = {dblp},
ee = {http://dx.doi.org/10.1016/S0026-2714(03)00263-4}, date = {2007-03-27},
keywords = {dblp }
}
::