%0 Journal Article %1 journals/technometrics/McKaneEM05 %A McKane, Scott W. %A Escobar, Luis A. %A Meeker, William Q. %D 2005 %J Technometrics %K dblp %N 2 %P 182-190 %T Sample Size and Number of Failure Requirements for Demonstration Tests With Log-Location-Scale Distributions and Failure Censoring. %U http://dblp.uni-trier.de/db/journals/technometrics/technometrics47.html#McKaneEM05 %V 47

@article{journals/technometrics/McKaneEM05, added-at = {2016-08-17T00:00:00.000+0200}, author = {McKane, Scott W. and Escobar, Luis A. and Meeker, William Q.}, biburl = {https://www.bibsonomy.org/bibtex/23275e5f0bd0d5fdae925b437357eea2e/dblp}, ee = {http://dx.doi.org/10.1198/004017005000000030}, interhash = {b71494814c078787ea8f1da90573c66b}, intrahash = {3275e5f0bd0d5fdae925b437357eea2e}, journal = {Technometrics}, keywords = {dblp}, number = 2, pages = {182-190}, timestamp = {2016-08-18T11:36:41.000+0200}, title = {Sample Size and Number of Failure Requirements for Demonstration Tests With Log-Location-Scale Distributions and Failure Censoring.}, url = {http://dblp.uni-trier.de/db/journals/technometrics/technometrics47.html#McKaneEM05}, volume = 47, year = 2005 }