%0 Conference Paper %1 conf/dac/WeiweiX86 %A Mao, Weiwei %A Ling, Xieting %B DAC %D 1986 %E Thomas, Don %I IEEE Computer Society Press %K dblp %P 236-242 %T Robust test generation algorithm for stuck-open fault in CMOS circuits. %U http://dblp.uni-trier.de/db/conf/dac/dac1986.html#WeiweiX86

@inproceedings{conf/dac/WeiweiX86, added-at = {2018-11-06T00:00:00.000+0100}, author = {Mao, Weiwei and Ling, Xieting}, biburl = {https://www.bibsonomy.org/bibtex/2375bb7301161fe8f1e370d666758783d/dblp}, booktitle = {DAC}, crossref = {conf/dac/1986}, editor = {Thomas, Don}, ee = {https://doi.org/10.1145/318013.318051}, interhash = {a7d89ce8052dea4ce75656eceebc3aba}, intrahash = {375bb7301161fe8f1e370d666758783d}, keywords = {dblp}, pages = {236-242}, publisher = {IEEE Computer Society Press}, timestamp = {2018-11-07T16:13:50.000+0100}, title = {Robust test generation algorithm for stuck-open fault in CMOS circuits.}, url = {http://dblp.uni-trier.de/db/conf/dac/dac1986.html#WeiweiX86}, year = 1986 }