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Modeling Power Supply Noise in Delay Testing.

by: Jing Wang 0006, Duncan M. Hank Walker, Xiang Lu, Ananta K. Majhi, Bram Kruseman, Guido Gronthoud, Luis Elvira Villagra, Paul J. A. M. van de Wiel, and Stefan Eichenberger
In: IEEE Design & Test of Computers, Vol. 24, Nr. 3 (2007) , p. 226-234.
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