%0 Conference Paper %1 conf/asicon/LiouJGGC11 %A Liou, Juin J. %A Jiang, Chang %A Guang-Biao, Cao %A Gung, Chang %A Chia, Feng %B ASICON %D 2011 %I IEEE %K dblp %P 256-258 %T Challenges of electrostatic discharge (ESD) protection in emerging silicon nanowire technology. %U http://dblp.uni-trier.de/db/conf/asicon/asicon2011.html#LiouJGGC11 %@ 978-1-61284-192-2

@inproceedings{conf/asicon/LiouJGGC11, added-at = {2016-06-22T00:00:00.000+0200}, author = {Liou, Juin J. and Jiang, Chang and Guang-Biao, Cao and Gung, Chang and Chia, Feng}, biburl = {https://www.bibsonomy.org/bibtex/2406026e384746481a4aa116142c1b20c/dblp}, booktitle = {ASICON}, crossref = {conf/asicon/2011}, ee = {http://dx.doi.org/10.1109/ASICON.2011.6157170}, interhash = {5a9f42bdaa593056a91c57157089b02f}, intrahash = {406026e384746481a4aa116142c1b20c}, isbn = {978-1-61284-192-2}, keywords = {dblp}, pages = {256-258}, publisher = {IEEE}, timestamp = {2016-06-23T11:39:00.000+0200}, title = {Challenges of electrostatic discharge (ESD) protection in emerging silicon nanowire technology.}, url = {http://dblp.uni-trier.de/db/conf/asicon/asicon2011.html#LiouJGGC11}, year = 2011 }