%0 Conference Paper %1 conf/isqed/WuC16 %A Wu, Meng-Yen %A Chiang, Meng-Hsueh %B ISQED %D 2016 %I IEEE %K dblp %P 169-172 %T Performance evaluation of stacked gate-all-around MOSFETs at 7 and 10 nm technology nodes. %U http://dblp.uni-trier.de/db/conf/isqed/isqed2016.html#WuC16 %@ 978-1-5090-1213-8

@inproceedings{conf/isqed/WuC16, added-at = {2016-06-03T00:00:00.000+0200}, author = {Wu, Meng-Yen and Chiang, Meng-Hsueh}, biburl = {https://www.bibsonomy.org/bibtex/24e3914742ebaa050e3db78f7fa60769d/dblp}, booktitle = {ISQED}, crossref = {conf/isqed/2016}, ee = {http://dx.doi.org/10.1109/ISQED.2016.7479195}, interhash = {7b01c273e5404c86d49f5af3818d3147}, intrahash = {4e3914742ebaa050e3db78f7fa60769d}, isbn = {978-1-5090-1213-8}, keywords = {dblp}, pages = {169-172}, publisher = {IEEE}, timestamp = {2016-06-04T11:50:58.000+0200}, title = {Performance evaluation of stacked gate-all-around MOSFETs at 7 and 10 nm technology nodes.}, url = {http://dblp.uni-trier.de/db/conf/isqed/isqed2016.html#WuC16}, year = 2016 }