%0 Conference Paper %1 conf/aspdac/LiuXCM17 %A Liu, Shanshan %A Xiao, Liyi %A Cao, Xuebing %A Mao, Zhigang %B ASP-DAC %D 2017 %I IEEE %K dblp %P 87-92 %T Reliability analysis of memories suffering MBUs for the effect of negative bias temperature instability. %U http://dblp.uni-trier.de/db/conf/aspdac/aspdac2017.html#LiuXCM17 %@ 978-1-5090-1558-0

@inproceedings{conf/aspdac/LiuXCM17, added-at = {2023-05-10T00:00:00.000+0200}, author = {Liu, Shanshan and Xiao, Liyi and Cao, Xuebing and Mao, Zhigang}, biburl = {https://www.bibsonomy.org/bibtex/24ff0d4925261e2d13b1f3e3f5005bc73/dblp}, booktitle = {ASP-DAC}, crossref = {conf/aspdac/2017}, ee = {https://doi.org/10.1109/ASPDAC.2017.7858301}, interhash = {d6797fe72d84fcab0134be6f4b48e757}, intrahash = {4ff0d4925261e2d13b1f3e3f5005bc73}, isbn = {978-1-5090-1558-0}, keywords = {dblp}, pages = {87-92}, publisher = {IEEE}, timestamp = {2024-04-10T04:17:16.000+0200}, title = {Reliability analysis of memories suffering MBUs for the effect of negative bias temperature instability.}, url = {http://dblp.uni-trier.de/db/conf/aspdac/aspdac2017.html#LiuXCM17}, year = 2017 }