%0 Conference Paper %1 conf/date/BlantonH97 %A Blanton, Ronald D. %A Hayes, John P. %B ED&TC %D 1997 %I IEEE Computer Society %K dblp %P 628 %T The input pattern fault model and its application. %U http://dblp.uni-trier.de/db/conf/date/edtc1997.html#BlantonH97 %@ 0-8186-7786-4

@inproceedings{conf/date/BlantonH97, added-at = {2022-05-20T00:00:00.000+0200}, author = {Blanton, Ronald D. and Hayes, John P.}, biburl = {https://www.bibsonomy.org/bibtex/259f0172d2d90a642e6b775842ddeb9d3/dblp}, booktitle = {ED&TC}, crossref = {conf/date/1997}, ee = {https://dl.acm.org/doi/10.5555/787260.787733}, interhash = {9db40cb5caf9dd1aec7199697b11cc85}, intrahash = {59f0172d2d90a642e6b775842ddeb9d3}, isbn = {0-8186-7786-4}, keywords = {dblp}, pages = 628, publisher = {IEEE Computer Society}, timestamp = {2024-04-09T12:36:28.000+0200}, title = {The input pattern fault model and its application.}, url = {http://dblp.uni-trier.de/db/conf/date/edtc1997.html#BlantonH97}, year = 1997 }