%0 Conference Paper %1 conf/itc/HalderBC03 %A Halder, Achintya %A Bhattacharya, Soumendu %A Chatterjee, Abhijit %B ITC %D 2003 %I IEEE Computer Society %K %P 665-673 %T Automatic Multitone Alternate Test Generation For RF Circuits Using Behavioral Models. %U http://dblp.uni-trier.de/db/conf/itc/itc2003.html#HalderBC03 %@ 0-7803-8106-8

@inproceedings{conf/itc/HalderBC03, added-at = {2023-12-12T19:46:48.000+0100}, author = {Halder, Achintya and Bhattacharya, Soumendu and Chatterjee, Abhijit}, biburl = {https://www.bibsonomy.org/bibtex/251fc3a8d5fd5fb6d4f0beca2c95471ea/admin}, booktitle = {ITC}, crossref = {conf/itc/2003}, ee = {http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1270895}, interhash = {25ee7cbd2cbda2d9e96c905102f74f84}, intrahash = {51fc3a8d5fd5fb6d4f0beca2c95471ea}, isbn = {0-7803-8106-8}, keywords = {}, pages = {665-673}, publisher = {IEEE Computer Society}, timestamp = {2023-12-12T19:46:48.000+0100}, title = {Automatic Multitone Alternate Test Generation For RF Circuits Using Behavioral Models.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2003.html#HalderBC03}, year = 2003 }