%0 Journal Article %1 journals/tim/AguileraMNGB02 %A Aguilera, Jaime %A Matias, G. %A de No, Joaquín %A Garcia-Alonso, Andrés %A Berenguer, Roc %D 2002 %J IEEE Trans. Instrumentation and Measurement %K dblp %N 3 %P 487-491 %T A comparison among different setups for measuring on-wafer integrated inductors in RF applications. %U http://dblp.uni-trier.de/db/journals/tim/tim51.html#AguileraMNGB02 %V 51

@article{journals/tim/AguileraMNGB02, added-at = {2019-10-19T00:00:00.000+0200}, author = {Aguilera, Jaime and Matias, G. and de No, Joaquín and Garcia-Alonso, Andrés and Berenguer, Roc}, biburl = {https://www.bibsonomy.org/bibtex/2601bfd7868ac5b0cc80a58e1914cbc0f/dblp}, ee = {https://doi.org/10.1109/TIM.2002.1017719}, interhash = {17e4a61bd22fcb6dd7ba383aed967fb8}, intrahash = {601bfd7868ac5b0cc80a58e1914cbc0f}, journal = {IEEE Trans. Instrumentation and Measurement}, keywords = {dblp}, number = 3, pages = {487-491}, timestamp = {2019-10-22T12:01:32.000+0200}, title = {A comparison among different setups for measuring on-wafer integrated inductors in RF applications.}, url = {http://dblp.uni-trier.de/db/journals/tim/tim51.html#AguileraMNGB02}, volume = 51, year = 2002 }