@inproceedings{conf/aspdac/AtienzaMBAVDN08,
title = {Reliability-aware design for nanometer-scale devices.},
author = {David Atienza and Giovanni De Micheli and Luca Benini and José L. Ayala and Pablo Garcia Del Valle and Michael DeBole and Vijay Narayanan},
booktitle = {ASP-DAC},
crossref = {conf/aspdac/2008},
pages = {549-554},
publisher = {IEEE},
url = {http://dblp.uni-trier.de/db/conf/aspdac/aspdac2008.html#AtienzaMBAVDN08},
year = {2008},
description = {dblp},
ee = {http://dx.doi.org/10.1109/ASPDAC.2008.4484011}, date = {2008-05-06},
keywords = {dblp }
}
::