%0 Conference Paper %1 conf/aspdac/ZhangITS11 %A Zhang, Xin %A Ishida, Koichi %A Takamiya, Makoto %A Sakurai, Takayasu %B ASP-DAC %D 2011 %I IEEE %K dblp %P 109-110 %T An on-chip characterizing system for within-die delay variation measurement of individual standard cells in 65-nm CMOS. %U http://dblp.uni-trier.de/db/conf/aspdac/aspdac2011.html#ZhangITS11 %@ 978-1-4244-7516-2

@inproceedings{conf/aspdac/ZhangITS11, added-at = {2018-03-23T00:00:00.000+0100}, author = {Zhang, Xin and Ishida, Koichi and Takamiya, Makoto and Sakurai, Takayasu}, biburl = {https://www.bibsonomy.org/bibtex/265823e585a77048074fa7d11d190567f/dblp}, booktitle = {ASP-DAC}, crossref = {conf/aspdac/2011}, ee = {http://dl.acm.org/citation.cfm?id=1950846}, interhash = {f84454c6401767af47e95310cca07e6b}, intrahash = {65823e585a77048074fa7d11d190567f}, isbn = {978-1-4244-7516-2}, keywords = {dblp}, pages = {109-110}, publisher = {IEEE}, timestamp = {2019-10-17T16:43:25.000+0200}, title = {An on-chip characterizing system for within-die delay variation measurement of individual standard cells in 65-nm CMOS.}, url = {http://dblp.uni-trier.de/db/conf/aspdac/aspdac2011.html#ZhangITS11}, year = 2011 }