@article{journals/mr/CapraraBBBCCCDFL02,
title = {Analyses on NVM Circuitry Delay Induced by Source & Drain BF2 Implant.},
author = {P. Caprara and A. Barcella and M. Beltramello and C. Brambilla and S. Cereda and C. Caimi and V. Contin and V. Daniele and M. Fontana and P. Lucarno},
journal = {Microelectronics Reliability},
number = {9-11},
pages = {1509-1511},
url = {http://dblp.uni-trier.de/db/journals/mr/mr42.html#CapraraBBBCCCDFL02},
volume = {42},
year = {2002},
description = {dblp},
ee = {http://dx.doi.org/10.1016/S0026-2714(02)00180-4}, date = {2007-03-25},
keywords = {dblp }
}