%0 Conference Paper %1 conf/date/SantosFTT03 %A Santos, Marcelino B. %A Fernandes, José M. %A Teixeira, Isabel C. %A Teixeira, João Paulo %B DATE %D 2003 %I IEEE Computer Society %K dblp %P 10994-10999 %T RTL Test Pattern Generation for High Quality Loosely Deterministic BIST. %U http://dblp.uni-trier.de/db/conf/date/date2003.html#SantosFTT03 %@ 0-7695-1870-2

@inproceedings{conf/date/SantosFTT03, added-at = {2023-03-24T00:00:00.000+0100}, author = {Santos, Marcelino B. and Fernandes, José M. and Teixeira, Isabel C. and Teixeira, João Paulo}, biburl = {https://www.bibsonomy.org/bibtex/26ca3f73ed708ea5728e540cd96c75e78/dblp}, booktitle = {DATE}, crossref = {conf/date/2003}, ee = {http://dl.acm.org/citation.cfm?id=1022852}, interhash = {cd75be2707b52bb24a1023c506c7b3b9}, intrahash = {6ca3f73ed708ea5728e540cd96c75e78}, isbn = {0-7695-1870-2}, keywords = {dblp}, pages = {10994-10999}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:54:02.000+0200}, title = {RTL Test Pattern Generation for High Quality Loosely Deterministic BIST.}, url = {http://dblp.uni-trier.de/db/conf/date/date2003.html#SantosFTT03}, year = 2003 }