@article{journals/sigsoft/SherriffNWV05,
title = {Early estimation of defect density using an in-process Haskell metrics model.},
author = {Mark Sherriff and Nachiappan Nagappan and Laurie Williams and Mladen A. Vouk},
journal = {ACM SIGSOFT Software Engineering Notes},
number = {4},
pages = {1-6},
url = {http://dblp.uni-trier.de/db/journals/sigsoft/sigsoft30.html#SherriffNWV05},
volume = {30},
year = {2005},
description = {dblp},
ee = {http://doi.acm.org/10.1145/1082983.1083285}, date = {2008-05-08},
keywords = {dblp }
}
::