%0 Conference Paper %1 conf/icip/ChoiK12 %A Choi, Jiwon %A Kim, Changick %B ICIP %D 2012 %I IEEE %K dblp %P 1037-1040 %T Unsupervised detection of surface defects: A two-step approach. %U http://dblp.uni-trier.de/db/conf/icip/icip2012.html#ChoiK12 %@ 978-1-4673-2534-9

@inproceedings{conf/icip/ChoiK12, added-at = {2017-05-25T00:00:00.000+0200}, author = {Choi, Jiwon and Kim, Changick}, biburl = {https://www.bibsonomy.org/bibtex/2d92c7a54841e70cbeed8c8ff0314eb3f/dblp}, booktitle = {ICIP}, crossref = {conf/icip/2012}, ee = {https://doi.org/10.1109/ICIP.2012.6467040}, interhash = {26e95f2e5181dcfe9646eb93235aa01a}, intrahash = {d92c7a54841e70cbeed8c8ff0314eb3f}, isbn = {978-1-4673-2534-9}, keywords = {dblp}, pages = {1037-1040}, publisher = {IEEE}, timestamp = {2019-10-17T12:11:24.000+0200}, title = {Unsupervised detection of surface defects: A two-step approach.}, url = {http://dblp.uni-trier.de/db/conf/icip/icip2012.html#ChoiK12}, year = 2012 }