%0 Conference Paper %1 conf/ets/FujibeSMMWMM16 %A Fujibe, Tasuku %A Shirahata, Kazuki %A Mizushima, Takeshi %A Matsumura, Hidenobu %A Watanabe, Daisuke %A Mineo, Hiroyuki %A Masuda, Shin %B ETS %D 2016 %I IEEE %K dblp %P 1-2 %T An optical/electrical test system for 100Gb/s optical interconnection devices with high volume testing capability. %U http://dblp.uni-trier.de/db/conf/ets/ets2016.html#FujibeSMMWMM16 %@ 978-1-4673-9659-2

@inproceedings{conf/ets/FujibeSMMWMM16, added-at = {2017-05-22T00:00:00.000+0200}, author = {Fujibe, Tasuku and Shirahata, Kazuki and Mizushima, Takeshi and Matsumura, Hidenobu and Watanabe, Daisuke and Mineo, Hiroyuki and Masuda, Shin}, biburl = {https://www.bibsonomy.org/bibtex/271c093854f209c7537b9c791c885fe65/dblp}, booktitle = {ETS}, crossref = {conf/ets/2016}, ee = {https://doi.org/10.1109/ETS.2016.7519282}, interhash = {618f5be07bf215b0775fbde1b9e7d128}, intrahash = {71c093854f209c7537b9c791c885fe65}, isbn = {978-1-4673-9659-2}, keywords = {dblp}, pages = {1-2}, publisher = {IEEE}, timestamp = {2019-10-17T15:59:35.000+0200}, title = {An optical/electrical test system for 100Gb/s optical interconnection devices with high volume testing capability.}, url = {http://dblp.uni-trier.de/db/conf/ets/ets2016.html#FujibeSMMWMM16}, year = 2016 }