%0 Journal Article %1 journals/tc/SethN81 %A Seth, Sharad C. %A Narayanaswamy, K. %D 1981 %J IEEE Trans. Computers %K dblp %N 12 %P 973-977 %T A Graph Model for Pattern-Sensitive Faults in Random Access Memories. %U http://dblp.uni-trier.de/db/journals/tc/tc30.html#SethN81 %V 30

@article{journals/tc/SethN81, added-at = {2015-12-22T00:00:00.000+0100}, author = {Seth, Sharad C. and Narayanaswamy, K.}, biburl = {https://www.bibsonomy.org/bibtex/27f0f5e1f2ecb84fe5775ded90f4126b8/dblp}, ee = {http://doi.ieeecomputersociety.org/10.1109/TC.1981.1675737}, interhash = {2d6262ddf87ed2830682821c6878f750}, intrahash = {7f0f5e1f2ecb84fe5775ded90f4126b8}, journal = {IEEE Trans. Computers}, keywords = {dblp}, number = 12, pages = {973-977}, timestamp = {2015-12-24T12:00:16.000+0100}, title = {A Graph Model for Pattern-Sensitive Faults in Random Access Memories.}, url = {http://dblp.uni-trier.de/db/journals/tc/tc30.html#SethN81}, volume = 30, year = 1981 }