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Coverage of Transistor-Level and Gate-Level Stuck-at Faults in CMOS Checkers.
Peter Lidén
, and
Peter Dahlgren
.
ISCAS,
page 2124-2127.
(
1995
)
@inproceedings{conf/iscas/LidenD95, added-at = {2002-04-30T00:00:00.000+0200}, author = {Lidén, Peter and Dahlgren, Peter}, biburl = {http://www.bibsonomy.org/bibtex/2869843efe6dca7619e4b369770fd1f0c/dblp}, booktitle = {ISCAS}, date = {2002-04-30}, description = {dblp}, interhash = {36ca0e02229b283c30b94cd56b1e786d}, intrahash = {869843efe6dca7619e4b369770fd1f0c}, keywords = {dblp}, pages = {2124-2127}, timestamp = {2002-04-30T00:00:00.000+0200}, title = {Coverage of Transistor-Level and Gate-Level Stuck-at Faults in CMOS Checkers.}, url = {http://dblp.uni-trier.de/db/conf/iscas/iscas1995-3.html#LidenD95}, year = 1995 }
%0 Conference Paper %1 conf/iscas/LidenD95 %A Lidén, Peter %A Dahlgren, Peter %B ISCAS %D 1995 %K %P 2124-2127 %T Coverage of Transistor-Level and Gate-Level Stuck-at Faults in CMOS Checkers. %U http://dblp.uni-trier.de/db/conf/iscas/iscas1995-3.html#LidenD95
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