%0 Conference Paper %1 conf/itc/CaiBMVB05 %A Cai, Yi %A Bhattacharyya, Amit %A Martone, Joe %A Verma, Anant %A Burchanowski, William %B ITC %D 2005 %I IEEE Computer Society %K dblp %P 8 %T A comprehensive production test solution for 1.5Gb/s and 3Gb/s serial-ATA - based on AWG and undersampling techniques. %U http://dblp.uni-trier.de/db/conf/itc/itc2005.html#CaiBMVB05 %@ 0-7803-9038-5

@inproceedings{conf/itc/CaiBMVB05, added-at = {2023-03-23T00:00:00.000+0100}, author = {Cai, Yi and Bhattacharyya, Amit and Martone, Joe and Verma, Anant and Burchanowski, William}, biburl = {https://www.bibsonomy.org/bibtex/28a53c5f4bbc23ddc4286b1d5c7961493/dblp}, booktitle = {ITC}, crossref = {conf/itc/2005}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.2005.1584026}, interhash = {164988c7f412f9cede1f5d31e3b9e3e0}, intrahash = {8a53c5f4bbc23ddc4286b1d5c7961493}, isbn = {0-7803-9038-5}, keywords = {dblp}, pages = 8, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:27:57.000+0200}, title = {A comprehensive production test solution for 1.5Gb/s and 3Gb/s serial-ATA - based on AWG and undersampling techniques.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2005.html#CaiBMVB05}, year = 2005 }