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dblp's BibTeX entry:  

Low-Transition Test Pattern Generation for BIST-Based Applications.

IEEE Trans. Computers, 57(3): 303-315, 2008.
Authors: Mehrdad Nourani and Mohammad Tehranipoor and Nisar Ahmed
URL: http://dblp.uni-trier.de/db/journals/tc/tc57.html#NouraniTA08
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@article{journals/tc/NouraniTA08,
title = {Low-Transition Test Pattern Generation for BIST-Based Applications.},
author = {Mehrdad Nourani and Mohammad Tehranipoor and Nisar Ahmed},
journal = {IEEE Trans. Computers},
number = {3},
pages = {303-315},
url = {http://dblp.uni-trier.de/db/journals/tc/tc57.html#NouraniTA08},
volume = {57},
year = {2008},
description = {dblp},
ee = {http://doi.ieeecomputersociety.org/10.1109/TC.2007.70794}, date = {2008-06-05},
keywords = {dblp }
}