%0 Conference Paper %1 conf/ats/HashizumeYYTKMT04 %A Hashizume, Masaki %A Yoneda, Daisuke %A Yotsuyanagi, Hiroyuki %A Tada, Tetsuo %A Koyama, Takeshi %A Morita, Ikuro %A Tamesada, Takeomi %B Asian Test Symposium %D 2004 %I IEEE Computer Society %K dblp %P 112-117 %T I_DDQ Test Method Based on Wavelet Transformation for Noisy Current Measurement Environment. %U http://dblp.uni-trier.de/db/conf/ats/ats2004.html#HashizumeYYTKMT04 %@ 0-7695-2235-1

@inproceedings{conf/ats/HashizumeYYTKMT04, added-at = {2023-03-24T00:00:00.000+0100}, author = {Hashizume, Masaki and Yoneda, Daisuke and Yotsuyanagi, Hiroyuki and Tada, Tetsuo and Koyama, Takeshi and Morita, Ikuro and Tamesada, Takeomi}, biburl = {https://www.bibsonomy.org/bibtex/29413598e83997ad24df28e5e14b9284f/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2004}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2004.50}, interhash = {76d1b6aaf26d428d5ba79711780b64ed}, intrahash = {9413598e83997ad24df28e5e14b9284f}, isbn = {0-7695-2235-1}, keywords = {dblp}, pages = {112-117}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:35:57.000+0200}, title = {I_DDQ Test Method Based on Wavelet Transformation for Noisy Current Measurement Environment.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2004.html#HashizumeYYTKMT04}, year = 2004 }