%0 Conference Paper %1 conf/isqed/WanK13 %A Wan, Jinbo %A Kerkhoff, Hans G. %B ISQED %D 2013 %I IEEE %K dblp %P 31-37 %T An arbitrary stressed NBTI compact model for analog/mixed-signal reliability simulations. %U http://dblp.uni-trier.de/db/conf/isqed/isqed2013.html#WanK13 %@ 978-1-4673-4951-2

@inproceedings{conf/isqed/WanK13, added-at = {2013-06-10T00:00:00.000+0200}, author = {Wan, Jinbo and Kerkhoff, Hans G.}, biburl = {https://www.bibsonomy.org/bibtex/2975ab718bc52a42db6745b4200bd8e6f/dblp}, booktitle = {ISQED}, crossref = {conf/isqed/2013}, ee = {http://dx.doi.org/10.1109/ISQED.2013.6523587}, interhash = {ad49e904652517aa37ba6bd965676592}, intrahash = {975ab718bc52a42db6745b4200bd8e6f}, isbn = {978-1-4673-4951-2}, keywords = {dblp}, pages = {31-37}, publisher = {IEEE}, timestamp = {2013-08-13T14:46:05.000+0200}, title = {An arbitrary stressed NBTI compact model for analog/mixed-signal reliability simulations.}, url = {http://dblp.uni-trier.de/db/conf/isqed/isqed2013.html#WanK13}, year = 2013 }