@inproceedings{conf/itc/JainW02,
title = {Scan Test Data Volume Reduction in Multi-Clocked Designs with Safe Capture Technique.},
author = {Vishal Jain and John A. Waicukauski},
booktitle = {ITC},
crossref = {conf/itc/2002},
pages = {148-153},
publisher = {IEEE Computer Society},
url = {http://dblp.uni-trier.de/db/conf/itc/itc2002.html#JainW02},
year = {2002},
description = {dblp},
ee = {http://csdl.computer.org/comp/proceedings/itc/2002/7543/00/75430148abs.htm}, date = {2004-01-14},
keywords = {dblp }
}
::