%0 Conference Paper %1 conf/itc/CraigJM02 %A Craig, Mark %A Jee, Alvin %A Maniar, Prashant %B ITC %D 2002 %I IEEE Computer Society %K dblp %P 350-356 %T An Integrated Approach to Yield Loss Characterization. %U http://dblp.uni-trier.de/db/conf/itc/itc2002.html#CraigJM02 %@ 0-7803-7543-2

@inproceedings{conf/itc/CraigJM02, added-at = {2023-03-23T00:00:00.000+0100}, author = {Craig, Mark and Jee, Alvin and Maniar, Prashant}, biburl = {https://www.bibsonomy.org/bibtex/291078020690b42b09b643d9ca939f33d/dblp}, booktitle = {ITC}, crossref = {conf/itc/2002}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.2002.1041778}, interhash = {29f8c050348de8a086016a8e13c313db}, intrahash = {91078020690b42b09b643d9ca939f33d}, isbn = {0-7803-7543-2}, keywords = {dblp}, pages = {350-356}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:28:16.000+0200}, title = {An Integrated Approach to Yield Loss Characterization.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2002.html#CraigJM02}, year = 2002 }