%0 Journal Article %1 journals/todaes/BiswasWB14 %A Biswas, Sounil %A Wang, Hongfei %A Blanton, R. D. (Shawn) %D 2014 %J ACM Trans. Design Autom. Electr. Syst. %K dblp %N 2 %P 20:1-20:23 %T Reducing test cost of integrated, heterogeneous systems using pass-fail test data analysis. %U http://dblp.uni-trier.de/db/journals/todaes/todaes19.html#BiswasWB14 %V 19

@article{journals/todaes/BiswasWB14, added-at = {2018-11-06T00:00:00.000+0100}, author = {Biswas, Sounil and Wang, Hongfei and Blanton, R. D. (Shawn)}, biburl = {https://www.bibsonomy.org/bibtex/2b149a003f25e5e862c72f16011d8d02e/dblp}, ee = {https://doi.org/10.1145/2566666}, interhash = {2fcaff28ae4fd7062eecba47bdd9eea0}, intrahash = {b149a003f25e5e862c72f16011d8d02e}, journal = {ACM Trans. Design Autom. Electr. Syst.}, keywords = {dblp}, number = 2, pages = {20:1-20:23}, timestamp = {2018-11-07T12:23:44.000+0100}, title = {Reducing test cost of integrated, heterogeneous systems using pass-fail test data analysis.}, url = {http://dblp.uni-trier.de/db/journals/todaes/todaes19.html#BiswasWB14}, volume = 19, year = 2014 }